VTS 2010 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems. Major topics include, but are not limited to:

Analog, M-S & RF Test
Automatic Test Generation
ATE Architecture & SW
Board & System Test
Built-In Self-Test (BIST)
Current Based Test
Defect Tolerance
Delay & Performance Test
Design for Testability (DFT)
Design Verification/Validation
Diagnosis and Debug
Embedded System and Microsystem Test
Embedded Test Methods
FPGA Test
Fault Modeling and Simulation
Infrastructure IP
MEMS and sensor Test
Memory Test and Repair
Microprocessor Test
Emerging technology Test
On-Line Test
Power Issues in Test
Self-Repair & Fault Tolerance
SOC and SiP Test
Standards
Test Economics
Thermal Test
Test of Biomedical Devices
Test of High-Speed I/O
Test Quality and Reliability
Test Resource Partitioning
Transients and Soft Errors
Yield Analysis & Optimization

Submissions

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The VTS Program Committee invites original, unpublished paper submissions for VTS 2010. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.

Proposals for the Innovative Practices track, and Special Sessions are also invited. The innovative practices track will highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations. Innovative practices track and special session proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.

All submissions are to be made electronically through the VTS website. The deadline for ALL submissions is September 20th 2009. Detailed instructions for submissions are to be found at the conference website http://www.tttc-vts.org. Authors will be notified of the disposition of their papers by 8th January 2010. A submission will be considered as evidence that, upon acceptance, the author(s) will present the paper at the symposium, and will submit a final camera-ready version of the paper for inclusion in the proceedings. In the case of innovative practice and special sessions, the organizers commit to submit a session title, abstract, and list of participants for inclusion in the symposium proceedings and program.

VTS 2010 will present a Best Paper Award, a Best Panel Award, and a Best IP Track Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges. We also plan to organize a Student Poster Competition and a TTTC Best Doctoral Thesis Contest, details will be available later.

TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during VTS 2010. Tutorial proposals should be submitted according to TTEP 2010 submission deadlines (http://computer.org/tab/tttc/teg/ttep).

Key Dates

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Submission deadline: September 20, 2009
Notification of acceptance: January 8, 2010

Additional Information

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General Chair
Magdy Abadir
Freescale Semiconductor
M.Abadir@freescale.com

Program Chairs

Michel Renovell
LIRMM
renovell@lirmm.fr

Claude Thibeault
ETS
claude.thibeault@etsmtl.ca

Committees

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Steering Committee
J. Figueras – U Pol Catalunya
A. Ivanov – U of British Columbia
M. Nicolaidis – TIMA
P. Prinetto – Polit di Torino
A. Singh – Auburn U
P. Varma – Blue Pearl
Y. Zorian – Virage Logic

For more information, visit us on the web at: http://www.tttc-vts.org

The 28th IEEE VLSI Test Symposium (VTS2010) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the IEEE Computer Society Design Automation Technical Committee.

TTTC's Electronic Broadcasting Service
	28th IEEE VLSI TEST SYMPOSIUM (VTS 2010) April 18-21, 2010 Santa Cruz, California, USA http://www.tttc-vts.org